The ‘high end’ U-4100 offers enormous flexibility for the evaluation and quality control of a wide variety of solid samples, typically optical components or coated surfaces, over a wavelength range of 240 to 2600 nm. The high performance optics include a prism/grating monochromator, infinitely variable slit, and integrating sphere as standard, and samples up to 200×200 mm in the standard version and up to 430×430 mm in the large sample version can be accommodated.
- Micro sample reflectance
- Wafer reflectance/transmission
- Optical thin film reflection
- Lens transmittance
- Solar cells and coated glass evaluation
High precision accessories can measure at a range of incident angles.
Therefore measurement methods including transmittance, relative refectance, absolute reflectance are available with high precision accessories to measure at a range of incident angles. For example one accessory for measurement of coated glass surfaces, the Variable angle absolute reflectance accessory (20 to 60°) measures the absolute reflectance and transmittance at a desired angle by rotating the detector (integrating sphere) and the sample stage independently.
Informations de commande: For more information on the range of accessories, please contact your local Avantor agency.