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Spectrophotometers, UV-Vis-NIR, U-4100

Fournisseur: VWR Collection
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Moyenne des Notes : 0.0 sur 5

1J1-0013 1J1-0003
634-0951EA 56180 EUR
634-0951 634-0952
Spectrophotometers, UV-Vis-NIR, U-4100
Spectrophotometers and Photometers UV/Visible Spectrophotometers
The ‘high end’ U-4100 offers enormous flexibility for the evaluation and quality control of a wide variety of solid samples, typically optical components or coated surfaces, over a wavelength range of 240 to 2600 nm. The high performance optics include a prism/grating monochromator, infinitely variable slit, and integrating sphere as standard, and samples up to 200×200 mm in the standard version and up to 430×430 mm in the large sample version can be accommodated.

  • Micro sample reflectance
  • Wafer reflectance/transmission
  • Optical thin film reflection
  • Lens transmittance
  • Solar cells and coated glass evaluation

High precision accessories can measure at a range of incident angles.

Therefore measurement methods including transmittance, relative refectance, absolute reflectance are available with high precision accessories to measure at a range of incident angles. For example one accessory for measurement of coated glass surfaces, the Variable angle absolute reflectance accessory (20 to 60°) measures the absolute reflectance and transmittance at a desired angle by rotating the detector (integrating sphere) and the sample stage independently.

Informations de commande: For more information on the range of accessories, please contact your local Avantor agency.
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